Câu 6: CT-AI: ISTQB Certified Tester - AI Testing

In which ONE of the following situations would an ML model be MOST effective at determining the criticality of new defects?

1. A. A new application which is in the early stages of the first test cycle
2. B. An old application with lots of defect records but a brand new development and test team
3. C. An old application where defect records are linked to failed tests and production incidents — đáp án hiện tại
4. D. An old application with few critical defect records and many non-critical defect records